Tessent
Tessent Scan and ATPG
The Tessent™ Scan and ATPG course will drive the development of your skills and knowledge in scan and ATPG design utilizing the Tessent Scan, Tessent FastScan™, and the Tessent Visualizer tools. The knowledge gained for generating test patterns in this class is directly applicable for generating test patterns for designs utilizing Tessent™ TestKompress™. ModelSim® is used to simulate test patterns to identify potential issues (mismatches) between the expected results from pattern generation and the Verilog simulation results. During this course, you will insert a full scan in a design using Tessent Scan, and create high-quality test patterns using the ATPG tool. You will also learn about ATPG compression techniques including an introduction to Tessent TestKompress.
The hands-on labs are designed to reinforce key concepts through practical experience and to develop proficiency with the Siemens EDA Tessent tool suite under the guidance of industry-expert instructors.
Prerequisites
- A basic background in DFT is helpful
PRIMARY COURSE TOPICS
You Will Learn How To
- Invoke the Tessent Shell environment in order to utilize Tessent Scan, Tessent FastScan, and Tessent TestKompress
- Setup and analyze designs to prepare for ATPG
- Perform ATPG to achieve high test coverage with a minimal number of patterns
- Troubleshoot DRC violations
- Troubleshoot areas of low test coverage
- Troubleshoot simulation mismatches