Tessent
Tessent YieldInsight

Course Code
294249-US
Software
Tessent 2023.3
Language
English
User Level
Advanced
Pricing ID
Select Country
List Price
Select Country
Price may not include taxes applicable to your billing region
Contact us for private event pricing
Live Online Duration
6 hours for each day for 3 days

The Tessent YieldInsight course will help you efficiently and effectively use the Tessent YieldInsight tool to analyze volumes of test failure data to identify the actual root cause of the failures. The tool uses Tessent Diagnosis generated diagnosis reports. The results of Tessent YieldInsight’s signature analyses provide valuable input to yield management systems, aid in the selection of dies for optimal results when they are subjected to physical failure analysis, and help improve the silicon ramp up and, over time, improve yield by identifying the root causes affecting yield using Tessent’s proprietary Root Cause Deconvolution statistical algorithms. This allows for proper corrective actions to be determined and implemented in a timely manner.

Hands-on lab exercises will reinforce lecture and discussion topics under the guidance of our industry-expert instructors.

PREREQUISITES

Familiarity with basic concepts of DFT, ATPG, Test environments, and diagnosis is a plus. Attended a Tessent Diagnosis class is another plus

PROVIDED COURSE MATERIALS
Class Package

This course is no longer offered. Contact us if you would like to schedule a training event at your facility.

For more information
Learning Services, EDA Singapore

PRIMARY COURSE TOPICS

What You’ll Learn

  • Basics of Tessent Diagnosis in terms of a high-level discussion reviewing elements of the Tessent Diagnosis course for an understanding of the Diagnosis report generation process
  • The Tessent YieldInsight usage model
  • How to navigate the Tessent YieldInsight graphical interface
  • How to drill down through the data using signatures and populations
  • What Root Cause Deconvolution is and how to work with the results
  • How to generate reports for signatures from the resulting tables
  • How to create scripts using the Tessent YieldInsight commands and Tcl statements for automation
  • How to create custom signatures to extend the tool’s functionality with regards to a user’s environment
  • How Tessent YieldInsight fits into a Statistical Diagnosis process
  • What DFM hits are and how to process and explore them

Throughout this course, extensive hands-on lab exercises provide you with practical experience using the Tessent YieldInsight software.

Hands-on lab topics include:

  • A dofile-driven demonstration of Tessent Diagnosis generating reports, importing them to Tessent YieldInsight, and viewing the suspect in Tessent YieldInsight’s Layout Viewer
  • Understanding the contents of the Tessent Diagnosis report
  • Running Tessent Diagnosis using the point tool and the Tessent Diagnosis Server
  • Tessent YieldInsight fundamentals of analysis set up, creating populations, and using visualizations
  • The Tessent YieldInsight usage model
  • Separating chain and logic failures in the initial population
  • Handling systematic failure reports
  • Performing quality checks and how to use signatures to drill down through the data
  • Chain defect analysis
  • Chains with high numbers of random defects
  • The process of running the RCD signature and using its results to drill down to the most probable root cause
  • Exporting table data using the GUI or command line.
  • Introduction to scripting using the Tessent YieldInsight commands and Tcl statements
  • Writing and using custom signatures
  • Processing DFM hits