The Tessent YieldInsight course will help you efficiently and effectively use the Tessent YieldInsight tool to analyze volumes of test failure data to identify the actual root cause of the failures. The tool uses Tessent Diagnosis generated diagnosis reports. The results of Tessent YieldInsight’s signature analyses provide valuable input to yield management systems, aid in the selection of dies for optimal results when they are subjected to physical failure analysis, and help improve the silicon ramp up and, over time, improve yield by identifying the root causes affecting yield using Tessent’s proprietary Root Cause Deconvolution statistical algorithms. This allows for proper corrective actions to be determined and implemented in a timely manner.
Hands-on lab exercises will reinforce lecture and discussion topics under the guidance of our industry-expert instructors.
Familiarity with basic concepts of DFT, ATPG, Test environments, and diagnosis is a plus. Attended a Tessent Diagnosis class is another plus
Throughout this course, extensive hands-on lab exercises provide you with practical experience using the Tessent YieldInsight software.