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On-Demand Training - Tessent Scan and ATPG

Description

This learning path will introduce you to scan and ATPG processes. You will gain knowledge on fault models, test pattern types and at-speed testing.

12 month subscription
Access to cloud-based environment for hands-on lab exercises
Access to new training content added during the subscription period
Knowledge assessments to measure learning progress

Explore This On-Demand Training

Content Details

Starting at
USD $1400.00 / year
Buy

Chapter

learning path

Getting Help With Tessent Tools

You will learn how to access infohub, get help within Tessent tools and use the Support Center.

Preview Chapter

Getting Help: Using Infohub

Chapters

learning path

Tessent Scan and ATPG On-Demand Training

This learning path will introduce you to scan and ATPG processes. You will gain knowledge on fault models, test pattern types and at-speed testing.

Preview Chapter

DFT Motivations

Tessent Scan and ATPG On-Demand Training 13 Chapters

This learning path will introduce you to scan and ATPG processes. You will gain knowledge on fault models, test pattern types and at-speed testing.

1 DFT Basic Concepts 11 Topics

DFT Motivations
Introduction to Scan Test and ATPG
Basic Scan Test Process
Knowledge Check 1: DFT Basic Concepts
Getting Started with Tessent Shell
Understanding Contexts and System Modes
Design Objects, Attributes and Data Models
Creating and Using Collections
Design Introspection
Knowledge Check 2: DFT Basic Concepts
Assessment: DFT Basic Concepts

2 Scan and Test Insertion 21 Topics

Tessent Scan Tool Flow Overview
Tessent Scan Setup
Scan/Test Logic Configurations
Knowledge Check 1: Scan and Test Insertion
Scan Design Rule Checks
Scan/Test Logic Insertion
Defining Scan Modes
Knowledge Check 2: Scan and Test Insertion
Balanced Scan Chains
Multi-Mode Scan Insertion
Tessent Scan TSDB FLow
Knowledge Check 3: Scan and Test Insertion
Introduction to VersaPoints Test Points
Inserting Test Points
Hierarchical DFT Flow Overview
Wrapper Chains Overview
Wrapper Chains Generation
Grayboxes Overview
Knowledge Check 4: Scan and Test Insertion
Lab: Configuring Scan Chains / Test Logic
Assessment: Scan and Test Insertion

3 The ATPG Flow 15 Topics

DFT Flow in Tessent Shell
Creating DFT Library
Defining Black Boxes
Knowledge Check 1: The ATPG Flow
ATPG Setup: Test Procedure Files
ATPG Setup: Dofiles
DC Scan Insertion Flow
Knowledge Check 2: The ATPG Flow
ATPG Setup Process
ATPG DRC Process
Configuring ATPG and Generating Patterns Process
ATPG Save Results Process
Knowledge Check 3: The ATPG Flow
Lab: Generating Test Patterns
Assessment: The ATPG Flow

4 Fault Grouping, Coverage and Transcripts 11 Topics

Defining the Fault Universe
Fault Classes: The Testable Faults (Part 1)
Fault Classes: The Testable Faults (Part 2)
Fault Classes: The Untestable Faults
Knowledge Check 1: Faults Grouping
Fault Subclasses
Test Coverage Reporting
Tessent Transcript / Logfile Overview
Knowledge Check 2: Faults Grouping
Lab: Understanding ATPG Messaging
Assessment: Faults Grouping

5 Additional Fault Models 21 Topics

The Bridge Fault Model
At-Speed Testing: The Transition Fault Model
At-Speed Testing: The Path Delay Fault Model
Knowledge Check 1: Additional Fault Models
User Defined Fault Model (UDFM)
Cell-Aware Model Overview
IDDQ Fault Model
Knowledge Check 2: Additional Fault Models
Toggle Fault Model
Automotive-Grade ATPG
Interconnect Bridge Defects
Knowledge Check 3: Additional Fault Models
Interconnect Open Defects
Cell Neighboring Bridge Defects
Automotive-Grade ATPG and Dignosis Flow
Critical Area Calculations
Timing-Aware ATPG Overview
Timing-Aware ATPG Details
Knowledge Check 4: Additional Fault Models
Lab: Additional Fault Models
Assessment: Additional Fault Models

6 Additional Test Pattern Types 7 Topics

Clock Sequential Patterns Overview
Clock Sequential Pattern Operation
Knowledge Check 1: Additional Test Pattern Types
Testing Around RAMs
Multiple Load Patterns
Knowledge Check 2: Additional Test Pattern Types
Assessment: Additional Test Pattern Types

7 Test Patterns Management 5 Topics

Generating and Reporting Test Patterns
Reusing and Debugging Patterns
Verification and Manufacturing Patterns
Lab: Understanding Test Pattern Generation
Assessment: Test Patterns Management

8 At-Speed Patterns and OCC 16 Topics

Transition Fault Model Detection
Path Delay Fault Model Detection
Knowledge Check 1: At-Speed Patterns and OCC
At-Speed Pattern Generation: Using Launch-Off-Capture/Broadside
At Speed Pattern Generation: Using Launch-Off-Shift
Fault Grading Patterns
Knowledge Check 2: At-Speed Patterns and OCC
Generating Internal Clocks
OCC Overview
Clock Control Definitions
Clock Control Definitions With ATPG
Named Capture Procedure
NCP Patterns Verification
Knowledge Check 3: At-Speed Patterns and OCC
Lab:Testing for High Quality
Assessment: At-Speed Patterns and OCC

9 Design Rule Overview 16 Topics

Flat Model Creation
ATPG Design Rule Checking
C1 Design Rule Check
C3/C4 Design Rule Checks
Knowledge Check 1: DRC
C6 Design Rule Check
D1 Design Rule Check
D5/D6 Design Rule Checks
E4 /E5 / E10 Design Rule Checks
Knowledge Check 2: DRC
Scan Chain Trace Rules
DRC Viewing
DRC Debugging Using Gate Reporting
Knowledge Check 3: DRC
Lab:Troubleshooting DRCs
Assessment: DRC

10 Troubleshooting Low Test Coverage 13 Topics

Identifying Sources and Areas of Low Coverage
Analyzing Faults in Tessent Visualizer
Knowledge Check 1: Troubleshooting Low Coverage
Analyzing Causes of Low Coverage: The Stuck-at-Faults
Analyzing Causes of Low Coverage: The Aborted Faults
Debugging Uncontrolled Faults
Debugging ATPG Untestable Faults
Knowledge Check 2: Troubleshooting Low Coverage
Debugging Transition and Path Delay Faults
ATPG Event Simulation
Knowledge Check 3: Troubleshooting Low Coverage
Lab: Troubleshooting Low Coverage
Assessment: Troubleshooting Low Coverage

11 Simulation Mismatch 21 Topics

Introduction to Simulation Mismatch
Parallel vs. Serial Testbench
Knowledge Check 1: Simulation Mismatch
Verilog Testbenches
Parallel Testbenches
Serial Testbenches
Knowledge Check 2: Simulation Mismatch
Simulation Mismatches Debugging: Obtaining Debug Files
Simulation Mismatches Debugging: Extracting Information
Simulation Mismatches Debugging: Tracing Back
Knowledge Check 3: Simulation Mismatch
Possible Mismatch Causes: Timing
Possible Mismatch Causes: CDD/NCP and Internal Pins
Possible Mismatch Causes: DRC
Knowledge Check 4: Simulation Mismatch
Possible Mismatch Causes: Library Problems
Simulation Mismatches Debugging: Implementing Solutions
Automatic Simulation Mismatch Analysis Flow
Knowledge Check 5: Simulation Mismatch
Lab: Debug Simulation Mismatches
Assessment: Simulation Mismatch

12 Pattern Optimization 8 Topics

Standard ATPG Process
ATPG Pattern Compression
Knowledge Check 1: Pattern Optimization
Clock Domain Analysis
ATPG create _patterns Command
EDT Compression Overview
Knowledge Check 2: Pattern Optimization
Assessment: Pattern Optimization

13 Getting Help 6 Topics

Getting Help: Using Infohub
Getting Help: Within Tessent Tools
Getting Help: Using the Support Center
Knowledge Check 1: Getting Help
Lab: Exploring the Help System
Assessment Getting Help

Chapter

learning path

Tessent Scan and ATPG Exam

Demonstrate your skills and knowledge in Tessent Scan and ATPG and earn a verifiable badge.

3 Learning Paths

14 Chapters

172 Topics

10 Hours of Video

Outline

Receive unlimited access to all new content added during your active subscription.

During your subscription period, you will automatically receive access to all new content added to the library, including training on new product releases and technology updates to maximize your proficiency.

On-Demand Training - Tessent Scan and ATPG

12 month subscription
Access to cloud-based environment for hands-on lab exercises
Access to new training content added during the subscription period
Knowledge assessments to measure learning progress

Starting at
USD $1400.00 / year

Buy

Change this page to

On-Demand Training - Tessent Scan and ATPG

Description

Explore This On-Demand Training

Content Details

Getting Help With Tessent Tools

Getting Help: Using Infohub

Getting Help With Tessent Tools 1 Chapter

1 Getting Help 6 Topics

Tessent Scan and ATPG On-Demand Training

DFT Motivations

Tessent Scan and ATPG On-Demand Training 13 Chapters

1 DFT Basic Concepts 11 Topics

2 Scan and Test Insertion 21 Topics

3 The ATPG Flow 15 Topics

4 Fault Grouping, Coverage and Transcripts 11 Topics

5 Additional Fault Models 21 Topics

6 Additional Test Pattern Types 7 Topics

7 Test Patterns Management 5 Topics

8 At-Speed Patterns and OCC 16 Topics

9 Design Rule Overview 16 Topics

10 Troubleshooting Low Test Coverage 13 Topics

11 Simulation Mismatch 21 Topics

12 Pattern Optimization 8 Topics

13 Getting Help 6 Topics

Tessent Scan and ATPG Exam

Tessent Scan and ATPG Exam 1 Chapter

1 Tessent Scan and ATPG Exam 1 Topic

On-Demand Training - Tessent Scan and ATPG

Change this page to

mouse On-Demand Training - Tessent Scan and ATPG

Description

Explore This On-Demand Training

Content Details

Getting Help With Tessent Tools

Getting Help: Using Infohub

Getting Help With Tessent Tools 1 Chapter

1 Getting Help 6 Topics

Tessent Scan and ATPG On-Demand Training

DFT Motivations

Tessent Scan and ATPG On-Demand Training 13 Chapters

1 DFT Basic Concepts 11 Topics

2 Scan and Test Insertion 21 Topics

3 The ATPG Flow 15 Topics

4 Fault Grouping, Coverage and Transcripts 11 Topics

5 Additional Fault Models 21 Topics

6 Additional Test Pattern Types 7 Topics

7 Test Patterns Management 5 Topics

8 At-Speed Patterns and OCC 16 Topics

9 Design Rule Overview 16 Topics

10 Troubleshooting Low Test Coverage 13 Topics

11 Simulation Mismatch 21 Topics

12 Pattern Optimization 8 Topics

13 Getting Help 6 Topics

Tessent Scan and ATPG Exam

Tessent Scan and ATPG Exam 1 Chapter

1 Tessent Scan and ATPG Exam 1 Topic

mouse On-Demand Training - Tessent Scan and ATPG

On-Demand Training - Tessent Scan and ATPG

On-Demand Training - Tessent Scan and ATPG